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相关技术

测量导致设备性能退化条件下的剩余寿命建模分析

  • 王小林 ,
  • 郭波 ,
  • 程志君
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  • 国防科技大学信息系统与管理学院,长沙 410073

王小林(1985-),男,云南曲靖人,博士研究生,研究方向:装备保障与可靠性分析。

收稿日期: 2010-09-06

  网络出版日期: 2025-05-30

基金资助

国家自然科学基金(60904002)资助

Modeling Analysis for Residual Life of Product Whose Performance Degradation Caused by Measurement

  • WANG Xiaolin ,
  • GUO Bo ,
  • CHENG Zhijun
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  • College of Information Systems and Management, National University of Defense Technology, Changsha 410073, China

Received date: 2010-09-06

  Online published: 2025-05-30

摘要

测量本身导致设备性能退化的情况是存在的,然而这个问题往往被研究者们所忽视。文中针对这种情况下的剩余寿命建模进行了研究。首先,在自然退化模型的基础上建立有损测量退化模型;其次给出了相应模型的参数估计方法和基于贝叶斯理论的设备剩余寿命的实时更新方法。最后通过一个仿真示例证明了研究这个问题的意义和文中建模的有效性。

本文引用格式

王小林 , 郭波 , 程志君 . 测量导致设备性能退化条件下的剩余寿命建模分析[J]. 弹箭与制导学报, 2011 , 31(4) : 180 -183,187 . DOI: 10.15892/j.cnki.djzdxb.2011.04.068

Abstract

The equipment's performance degradation incurred by measurement usually exists. However, this problem is often ignored by researchers. The residual life model considering this situation was studied in this paper. Firstly, a damage measurement degradation model was presented on the basis of the natural degradation model. Then the parameter estimation method for the proposed model and real-time updating method for the equipment's residual life based on Bayes theory were given. Finally, a simulation example was used to testify the significance of this research and the validity of the proposed model.

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参考文献

[1]
Lu C,Meeker W. Using degradation measures to estimate a time-to-failure distribution[J]. Technometrics, 1993,35(2):161-174.
[2]
Yang K,Yang G. Degradation reliability assessment using severe critical values[J].International Journal of Reliability,Quality and Safety Engineering,1998,5(1):85-95.
[3]
Sheng-Tsaing Tseng,Chien-Yu Peng.Stochastic diffusion modeling of degradation data[J]. Journal of Data Science,2007(5):315-333.
[4]
张永强,冯静,刘琦,等.基于Poisson-Normal过程性能退化模型的可靠性分析[J].系统工程与电子技术,2006,28(11):1775-1778.
[5]
赵建印,彭宝华,孙权,等.金属化膜脉冲电容器退化失效分析[J].高电压技术,2006,32(3):62-64.
[6]
赵炤,董豆豆,周经伦,等.基于贝叶斯方法的退化失效型产品实时可靠性评估[J].国防科技大学学报,2007,29(6):115-120.
[7]
Zhao-Jianyin,Liu-Fang. Reliability assessment of the metalized film capacitors from degradation data[J].Micro-electronics Reliability,2007,47(2/3):434-436.
[8]
赵建印,刘芳.产品加速退化失效模型与统计分析[J].哈尔滨工业大学学报,2008,40(12):2088-2090.
[9]
Gebraeel N, Lawley M, Liu R, et al. Residual life predictions from vibration-based degradation signals: A neural network approach [J]. IEEE Transactions on industrial electronics, 2004, 51(3): 694-700.
[10]
Gebraeel NZ, LAWLEY MA, LI R, et al. Residual-life distributions from component degradation signals: A Bayesian approach[J]. IIE Transactions, 2005, 37: 543-557.
[11]
Elwany A, Gebraeel N. Real-time estimation of mean remaining life using sensor-based degradation models [J]. Journal of Manufacturing Science and Engineering, 2009, 131(5): 131-139.
[12]
Gebraeel N, Elwany A, Pan J. Residual life predictions in the absence of prior degradation knowledge [J]. IEEE Transactions on Reliability, 2009, 58(1): 106-117.
[13]
WHITMORE GA. Estimating degradation by a wiener diffusion process subject to measurement error [J]. Life time Data Analysis, 1995, 1(3): 307-319.
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