为了研究弹载存储设备的失效模式,首先对弹载存储设备结构进行分析,并对其进行倾彻模拟分析,得出冲击会使测试仪电路腔发生严重形变、测试仪电路受到挤压甚至破碎。其次对其外壳进行了冲击仿真,得出弹载存储设备壳体高冲击环境下的损伤主要是存储设备的外壳因塑性变形引起的分层。最后针对该弹载记录仪进行侵彻试验,由此得出该弹载存储设备在该环境下的薄弱环节,该结果为提高弹载存储设备的可靠性分析提供依据。

The structure of missile-borne storage device was analyzed to get the failure modes of it. Then penetration simulation of the storage device was analyzed and the tester circuit cavity was seriously deformed after shock, thus the circuit tester is prone to be squeezed or even broken. After that, the impact of the shell was simulated; the missile-borne storage equipment shell under high impact damage is mainly due to storage equipment shell's spallation induced by plastic deformation. Finally, penetration test was carried out for this missile-borne storage device: the weak link of the missile-borne storage equipment was given in this environment. This result provides the basis for reliability analysis of missile-borne storage device.