为了研究引信电子延时装置储存性能变化及原因,定位退化或失效元器件,以接近质保期的两个引信电子延时装置为样本开展加速试验,并通过电路仿真模拟,分析可能出现失效的元件为陶瓷电容和末级三极管,得出电子延时装置储存失效或退化的原因是陶瓷电容层间膨胀幅度不同,容值减小以及末级三极管引线键合界面微裂纹扩展。结果表明,通过加速试验与电路仿真相结合的方法可以找出失效元器件并分析其性能退化原因。

To study change and reasons of storage performance of fuze electronic delayer and locate degradation or failure components, an accelerated test was launched with two electronic delayer samples of real-world-storage close to guarantee period. The probable failure components, ceramic capacitor and transistors were found out through circuit simulation. Temperature imbalance distribution leads to different interlayer expansion rate of ceramic capacitor and the wire bonding interface crack of transistors expands under temperature and humidity stress cycle. The result shows that through accelerated test and circuit simulation, the failure components can be found and the causes of the degradation can be analyzed.